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	Signal detection techniques for scattering-type scanning near-field optical microscopy
	Dai, Guangbin1,2; Yang, Zhongbo2; Geng, Guoshuai1,2; Li, Mingliang1; Chang, Tianying1,2; Wei, Dongshan2; Du, Chunlei2; Cui, Hong-Liang1,2; Wang, Huabin2,3
	2018
摘要	Scattering-type scanning near-field optical microscopy (s-SNOM) has been playing more and more important roles in investigating electromagnetic properties of various materials and structures on the nanoscale. In this technique, a sharp tip is employed as the near-field antenna to measure the sample's properties with a high spatial resolution. As the scattered near-field signal from the tip is extremely weak and contaminated by strong background noise, the effective detection, and subsequent extraction of the near-field information from the detected signals is the key issue for s-SNOM. In this review, we give a systematic explanation of the underlying mechanisms of s-SNOM, and summarize and interpret major signal detection techniques involved, including experimental setups, theories for signal analysis and processing, and exposition of advantages and disadvantages of such techniques. By this, we hope to provide a practical guide and a go-to source of detailed information for those interested in and/or working on s-SNOM. © 2018, © 2018 Taylor & Francis Group, LLC.
DOI	10.1080/05704928.2018.1443275
发表期刊	Applied Spectroscopy Reviews
ISSN	05704928
卷号	53期号:10页码:806-835
收录类别	SCI
语种	英语
EISSN	1520569X